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3XC-NA
Multiple AFM Cantilevers with Al Reflective Coating for Various Applications
AFM probes of the 3XC series feature three different AFM cantilevers for various measurement modes:
500DC - Contact mode AFM cantilever
240AC - Soft tapping mode AFM cantilever for imaging soft samples
200AC - Standard tapping mode AFM cantilever
OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.
AFM Tip
Height
Half Cone Angle
Radius
12-16 [µm]
0° front, 35° back, <9° side
< 7 nm
AFM Cantilever
Force Constant
Resonance Frequency
Length
CB1: 9[N/m]
CB2: 2.5[N/m]
CB3: 0.3[N/m]
CB1: 150[kHz]
CB2: 75[kHz]
CB3: 17[kHz]
CB1: 500[µm]
CB2: 240[µm]
CB3: 175[µm]
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