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240AC-PP

Soft Tapping Mode AFM Cantilever with Pt Overall Coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

The 240AC-PP AFM probes are designed for tapping mode electrical characterization measurements such as Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), etc.

OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.

AFM Tip

Height
Half Cone Angle
Radius
12-16 [µm]
0° front, 35° back, <9° side
<25 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
2 [N/m]
70 [kHz]
240 [µm]

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