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240AC-NG
Soft Tapping Mode AFM Cantilever with Au Reflective Coating
AFM probes of the 240AC series are designed for tapping mode AFM imaging of soft samples.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
The uncoated AFM tip offers a sharp AFM tip apex and chemical inertness. The back side gold coating ensures high and stable laser reflectivity in air, vacuum , liquid and aggressive chemical environments.
OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.
AFM Tip
Height
Half Cone Angle
Radius
12-16 [µm]
0° front, 35° back, <9° side
< 7 nm
AFM Cantilever
Force Constant
Resonance Frequency
Length
2 [N/m]
70 [kHz]
240 [µm]
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