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240AC-MA
Soft Tapping Mode AFM Cantilever with Magnetic Tip Coating
The 240AC-MA AFM probes are designed for Magnetic Force Microscopy (MFM) measurements.
The hard magnetic AFM tip side coating ensures high magnetic force sensitivity and resolution. The back side aluminum coating significantly enhances the AFM cantilever reflectivity in air and vacuum.
OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.
AFM Tip
Height
Half Cone Angle
Radius
12-16 [µm]
0° front, 35° back, <9° side
< 60 nm
AFM Cantilever
Force Constant
Resonance Frequency
Length
2 [N/m]
70 [kHz]
240 [µm]
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