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240AC-FG

High Aspect Ratio Soft Tapping Mode AFM Cantilever with Au Reflective Coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

The 240AC-FG AFM probes with carbon nanofibers at the end of the silicon AFM tips are designed for soft tapping mode AFM imaging of deep trenches. The typical fiber radius of curvature is 10 nm and the diameter is 50 nm at a height of 200 nm away from the apex.

The terahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

The gold coating ensures high and stable laser reflectivity in air, vacuum and liquids. Please note that while the tetrahedral AFM tip and the AFM tip side of the AFM cantilever are gold coated, the diamond-like spike remains uncoated.

OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.

AFM Tip

Height
Half Cone Angle
Radius
12-16 [µm]
N/A
< 10 nm

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
2 [N/m]
70 [kHz]
240 [µm]

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