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160AC-SG
High Resolution Standard Tapping Mode AFM Cantilever with Au Reflective Coating
The 160AC-SG AFMM probes with sharp diamond-like spikes are designed for high resolution tapping mode AFM imaging.
The terahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
The gold coating ensures high and stable laser reflectivity in air, vacuum and liquids. Please note that while the tetrahedral AFM tip and the AFM tip side of the AFM cantilever are gold coated, the diamond-like spike remains uncoated.
OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.
AFM Tip
Height
Half Cone Angle
Radius
12-16 [µm]
N/A
< 1 nm
AFM Cantilever
Force Constant
Resonance Frequency
Length
26 [N/m]
300 [kHz]
160 [µm]
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