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160AC-NA

Standard Tapping Mode AFM Cantilever with Al Reflective Coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

AFM probes of the 160AC series are designed for standard tapping mode AFM imaging in air or vacuum.

The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

The uncoated AFM tip offers a sharp AFM tip apex and chemical inertness. The back side aluminum coating significantly enhances the AFM cantilever reflectivity in air and vacuum. For operation in liquids we recommend using the 160AC-NG with a reflective gold coating.

OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.

AFM Tip

Height
Half Cone Angle
Radius
12-16 [µm]
0° front, 35° back, <9° side
< 7 nm

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
26 [N/m]
300 [kHz]
160 [µm]

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