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PPP-NCHR

PointProbe® Plus Non-Contact / Tapping Mode - Reflex Coating
新皋企業 NANOSENSORS PPP-NCR AFM 原子力顯微鏡探針

NANOSENSORS™ PPP-NCR AFM probes are especially designed with the same mechanical properties as the Olympus** AC160 AFM probe for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode).This AFM probe combines high operation stability with outstanding sensitivity.

The reflective coating is an approximately 30 nm thick aluminum coating on the detector side of the AFM cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the AFM cantilever. As the coating is nearly stress-free the bending of the AFM cantilever due to stress is less than 2 degrees.

AFM Tip

Height
Half Cone Angle
Radius
10-15 [µm]
axis:20° , side:25°-30° , apex:10°
<7 [nm]

AFM Cantilever

Force Constant 
Resonance Frequency
Length 
42 [N/m]
330 [kHz]
125 [µm]

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